Showing results: 1 - 15 of 126 items found.
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EQSFP28 -
Optellent, Inc.
The OPTELLENT EQSFP28 is a cost-effective and convenient test board for testing QSFP28 optical transceivers in R&D and manufacturing environments. The EQSFP28 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The EQSFP28 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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EQSFP10 -
Optellent, Inc.
The OPTELLENT EQSFP10 is a cost-effective and convenient test board for testing QSFP/QSFP+ optical transceivers in R&D and manufacturing environments. The EQSFP10 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The EQSFP10 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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ESFP280 -
Optellent, Inc.
The OPTELLENT ESFP280 is a cost-effective and convenient test board for testing SFP/SFP+/SFP28 optical transceivers in R&D and manufacturing environments. The ESFP280 is equipped with high quality RF connectors for data signals and test points for low frequency control and status signals. The ESFP280 is equipped with power supplies to enable voltage margining. Key status signals are displayed using LED indicators.
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787047-01 -
NI
12 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5830 supports validation and production test into mmWave frequency bands. This vector signal transceiver incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe-5830 helps you test a variety of cellular and wireless standards such as Wi-Fi 6. You can expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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ATS-3100 VRS -
Astronics Corporation
The ATS-3100 VRS, the newest member of the ATS-3100 PXI Integration Platform product family and fifth-generation radio test solution, is a single, consolidated platform for testing legacy, modern, and next-gen, software-defined radios for military, civil, and commercial users. Integrating the PXI Vector Signal Transceiver (VST) from National Instruments (NI), the platform enables faster test time with wider bandwidth (up to 1GHz) than any other radio test solution available today.
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Keysight Technologies
Get both signal generation and analysis in one PXIe module with real-time field-programmable gate array (FPGA)-accelerated measurements for faster throughput. The PXIe vector transceiver is perfect for manufacturing test of wireless devices, RF power amplifiers, and front-end modules.
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PXP-500A -
Teledyne LeCroy
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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27014 -
Chroma ATE Inc.
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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TS-960e -
Marvin Test Solutions, Inc.
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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17020E -
Chroma ATE Inc.
Charge/discharge modes (CC, CV, CP)Power Range: 10kW / 20kW per channelVoltage Range: 60V/ 100VCurrent Range: 100A/200A/300A/400A/ 500A/600A/700A/800A per channelRegenerative battery energy discharge, efficiency 85%Channels paralleled for higher currentsDriving cycle simulationFast current conversion without current interruptHigh precision measurementSmooth current without over shootTest data analysis functionData recovery protection (after power failure)Independent protection of multi-channel
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3380P -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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17040E -
Chroma ATE Inc.
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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3380D -
Chroma ATE Inc.
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.